Agenda
Session Chair: Ricco Walter | Systema
11:00 - 11:10
Detecting Contamination Events Caused by Nanoparticles
Dominik Groth, TSI
11:10 - 11:20
Robust Metallization for high power chips used by Infineon
Dmitry Balashov, Infineon Technologies
11:20 - 11:30
NXTGEN High Tech Equipment, enables the next generation of Semicon
Ivan Stojanovic, NXTGEN Hightech
11:30 - 11:45
Questions and Answers
