Agenda Session Chair: Christoph Kögler | Infineon Technologies 14:00 – 14:10 Optimizing Semiconductor Manufacturing: A Modular Machine Vision ApproachThomas Karow, Basler AG 14:10 – 14:20Data-driven optimization in semiconductor manufacturingLouis Schäfer, Adesso 14:20 – 14:30Root Cause Analysis – from correlation to causationMark Herrmann, Bosch 14:30 – 14:45Questions and Answers

Agenda Session Chair: Ricco Walter | Systema 11:00 – 11:10Detecting Contamination Events Caused by NanoparticlesDominik Groth, TSI 11:10 – 11:20Robust Metallization for high power chips used by InfineonDmitry Balashov, Infineon Technologies 11:20 – 11:30NXTGEN High Tech Equipment, enables the next generation of SemiconIvan Stojanovic, NXTGEN Hightech 11:30 – 11:45Questions and Answers