CEA-Leti Nano-characterization platform
The nanocharacterization platform of CEA-LETI and its role in the project ASCENT+ will be presented. CEA-LETI, one of the major RTI in Europe, offers a unique innovation ecosystem with shared technology platforms. The nanocharacterization platform offer a set of complementary characterisation techniques in various fields such as X-ray analysis, electron microscopy, ion beams analysis, surface analysis, near-field analysis, optics characterization and sample preparation. The EU project ASCENT+ providing acces to EU infrastrucutres for Nanoelectronic, aims to establish new knowledge and/or to explore the feasibility of a new or improved technology, product, process, service, method, tool or solution.