Co-Speaker: Dr. Carlos Viol Barbosa
Correlative materials characterization requires to manage unorganized data with complex format from several analytical techniques, particularly image data from microscopy techniques. Scanning electron microscopy and atomic force microscopy are two complementary techniques that provide structural and surface information on the nanoscale. Integrating a compact AFM into a SEM is an approach with completely new possibilities for fundamental research as well as for chemical and semiconductor industry. Fully automated correlative imaging analysis using AI algorithms, allowing a precise and accurate analysis of multimodal data, will be presented. The solution is a joined development of NenoVision (Brno, Czech Republic) and ScienceDesk (Freital, Germany).