1327Artificial Intelligence


Dr. Carlos Viol Barbosa

Sciencedesk GmbH

Dr. Carlos Viol Barbosa

Material characterization using correlative microscopy and artificial intelligence

Scanning electron microscopy and atomic force microscopy are two complementary techniques that provide structural and surface information on the nanoscale. Integrating a compact AFM into a SEM is an approach with completely new possibilities for fundamental research as well as for chemical and semiconductor industry. Fully automated correlative imaging analysis using AI algorithms, allowing a precise and accurate analysis of multimodal data, will be presented. The solution is a joined development of NenoVision (Brno, Czech Republic) and ScienceDesk (Freital, Germany).

Co-Speaker: Jan Neuman



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