Co-Speaker: Jan Neuman
Scanning electron microscopy and atomic force microscopy are two complementary techniques that provide structural and surface information on the nanoscale. Integrating a compact AFM into a SEM is an approach with completely new possibilities for fundamental research as well as for chemical and semiconductor industry. Fully automated correlative imaging analysis using AI algorithms, allowing a precise and accurate analysis of multimodal data, will be presented. The solution is a joined development of NenoVision (Brno, Czech Republic) and ScienceDesk (Freital, Germany).