Speaker

AI based image classification in production environments - strategies & challenges

Optical defect inspection and classification is an important part of semiconductor manufacturing. They provide relevant information to correct process problems and thus improve product yield and quality. The highly automated inspection and microscopy systems generate an enormous amount of data. AI-based methods are an appropriate way to ensure 100% classification coverage, to improve monitoring accuracy and to support anomaly detection.
convanit GmbH & Ko KG developed a software with the use of an AI-based system for optical image classification. This speech describes the requirements for such a system as well as the system itself and the results.